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Analytic modeling of loss and cross-coupling in capacitive micromachined ultrasonic transducers

机译:电容式微加工超声换能器中损耗和交叉耦合的解析模型

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摘要

The structural loss mechanism of capacitive micromachined ultrasonic transducer (cMUT) is investigated using finite element analysis and the normal mode theory. A single micromachined transducer membrane on an infinite silicon substrate is simulated by incorporating absorbing boundary conditions in the finite element method. This enables direct evaluation of the mechanical impedance of the membrane. Furthermore, the field distribution along the thickness of the silicon substrate due to outward radiating wave modes is obtained. The normal mode theory is applied to extract the contributions of different wave modes to the complicated field distributions. It is found that, the lowest order Lamb wave modes are responsible for the loss. Evaluation of absolute and relative power losses due to individual modes indicate that the lowest order anti-symmetric (A0) mode is the dominant radial mode in agreement with experimental measurements. The results of the analysis are used to derive a detailed equivalent circuit model of a cMUT with structural loss.
机译:利用有限元分析和法向模态理论研究了电容式微加工超声换能器(cMUT)的结构损耗机理。通过将吸收边界条件合并到有限元方法中,模拟了无限硅基板上的单个微加工换能器膜。这样可以直接评估膜的机械阻抗。此外,获得了由于向外辐射波模式而沿着硅衬底的厚度的场分布。运用正态模理论提取不同波模对复杂场分布的贡献。发现,最低阶兰姆波模式是造成损失的原因。对由于各个模式引起的绝对和相对功率损耗的评估表明,最低阶的反对称(A0)模式是主导径向模式,与实验测量结果一致。分析结果用于导出具有结构损耗的cMUT的详细等效电路模型。

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